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The new NIST soft and tender beamlines (80 eV -7.5 KeV x-rays)
at NSLS II 7-ID are now in operation.

A new VPPEM microscope has been developed as the endstation of
both NIST beamlines. This is a first for photoelectron microscopy.
The VPPEM used X-ray photoelectron
spectra to create this image.

X-ray photoelectron spectra give elemental
compositions, chemical state, local atomic
coordination, semiconductor band structure,
magnetic properties, and other details of
materials structure.
VPPEM is a new class of  microscope being
developed at the National Synchrotron Light
Source (NSLS II), Brookhaven National

VPPEM images give the composition and
chemistry of the sample surface at high
spatial resolution, with a very high depth of
see also:
VPPEM image of Al-Ca alloy
Recent publications:
Covid-19 has slowed down our commissioning of the microscope.
mouseover to see schematic